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Hysteresis Loop Measurement Instrument For Scientific Research
Using the magneto-optical Kerr effect, this instrument provides high-precision characterization of magnetism in ferromagnetic, artificial antiferromagnetic, 2D materials, and microelectronic devices. It can simultaneously scan in-plane and out of plane magnetic fields to obtain hysteresis loops for any combination of in-plane/out of plane magnetic fields and in-plane/out of plane components. With a Kerr angle detection precision of up to 0.3 mdeg (RMS), it can detect the magnetization strength of single-atom layers and provides a tiltable sample holder for electrical/magneto-optical property characterization.
Equipment Performance Indicator | Description |
---|---|
Kerr Angle Resolution | 0.3 mdeg (RMS) |
In-Plane Magnetic Field | 1 T@air gap 8 mm; 0.5 T@air gap 16 mm |
Vertical Magnetic Field | 1 T@air gap 7 mm; 0.5 T@air gap 16 mm |
Magnetic Field Resolution | PID closed-loop feedback regulation, resolution 0.02 mT |
Multi-Axis Displacement Stage | X, Y, θ,φ automatic laser alignment |
Testing Functions | Convenient and precise control of magnetic field output; realization of longitudinal and polar hysteresis loop scanning, automatic correction and normalization of hysteresis loops, and automatic extraction of saturated Kerr angle and coercive field parameters. |