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High Stability AFM For Materials Biology And Electronics Imaging
The Atomic Force Microscope is a cutting-edge scientific instrument that offers high-resolution imaging and precise measurements for a wide range of applications in nanotechnology, material science, and biological research. This advanced microscope utilizes XYZ Three-axis Full Sample Scanning method, allowing for detailed analysis of samples with exceptional accuracy.
One of the key features of the Atomic Force Microscope is its ability to accommodate samples up to 25 mm in size, providing flexibility and versatility for various research needs. Whether you are examining small nanomaterials or larger biological samples, this microscope can handle a wide range of sample sizes with ease.
When it comes to precision, the Atomic Force Microscope delivers outstanding performance with a low noise level of 0.4 nm in the XY direction. This ensures that your measurements are free from interference, allowing you to obtain accurate and reliable data for your experiments.
Furthermore, the Atomic Force Microscope offers excellent linearity with only 0.02% nonlinearity in the XY direction and 0.08% in the Z direction. This high level of linearity ensures that your measurements are highly accurate and consistent, enabling you to capture the subtle details of your samples with precision.
In terms of scanning capabilities, the Atomic Force Microscope provides a scanning rate ranging from 0.1 to 30 Hz, allowing you to adjust the scanning speed according to your specific requirements. Whether you need to quickly scan a large area or perform detailed scans at a slower pace, this microscope offers the flexibility to meet your research needs.
With its advanced features and capabilities, the Atomic Force Microscope is suitable for a wide range of imaging modes, including Contact Mode, Non-contact Mode, and Multiple Modes. This versatility allows you to choose the most appropriate mode for your specific application, whether you need high-resolution images, precise measurements, or gentle imaging of delicate samples.
Overall, the Atomic Force Microscope is a powerful and versatile instrument that offers exceptional performance for scientific research and analysis. With its XYZ Three-axis Full Sample Scanning method, large sample size capacity, low noise levels, high linearity, and adjustable scanning rate, this microscope provides researchers with the tools they need to explore the nanoscale world with precision and accuracy.
| Scanning Range | 100 μm X100 μm x 10 μm |
| Nonlinearity | 0.02% In The XY Direction And 0.08% In The Z Direction |
| Noise Level in The Z Direction | 0.04 Nm |
| Scanning Method | XYZ Three-axis Full Sample Scanning |
| Scanning Rate | 0.1-30 Hz |
| Noise Level in The XY Direction | 0.4 Nm |
| Sample Size | 25 Mm |
Truth Instruments' Atomic Force Microscope, the AtomEdge Pro, is a cutting-edge instrument designed for nanoscale analysis, nanomechanical testing, and surface property mapping. With its exceptional performance attributes and precise capabilities, this device is ideal for a wide range of product application occasions and scenarios.
Manufactured in CHINA, the AtomEdge Pro offers a scanning rate ranging from 0.1 to 30 Hz, allowing for quick and accurate scans of samples. The low noise level in the XY direction at 0.4 Nm ensures high-quality imaging and measurement results, making it suitable for applications requiring detailed surface analysis.
The scanning range of 100 μm x 100 μm x 10 μm provides versatility in sample sizes, accommodating various materials and structures for comprehensive testing. The XYZ three-axis full sample scanning method enables precise positioning and scanning of samples, essential for detailed nanomechanical testing and surface property mapping.
Furthermore, the AtomEdge Pro boasts excellent linearity with only 0.02% in the XY direction and 0.08% in the Z direction, ensuring accurate and reliable measurements for advanced research and development purposes.
Product application occasions for the AtomEdge Pro include academic research institutions, materials science laboratories, semiconductor industry, biotechnology companies, and more. Researchers and scientists can utilize this advanced atomic force microscope for studying surface characteristics, mechanical properties, and nanoscale structures of various materials.
Scenarios where the AtomEdge Pro excels include topographical imaging of nanomaterials, force spectroscopy for mechanical property analysis, surface roughness measurements, and adhesion force mapping. Its high precision and performance make it an indispensable tool for conducting in-depth analysis and research in the field of nanotechnology.