Truth Instruments Co., Ltd.
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Multi Functional Atomic Force Microscope With MFM EFM PFM Modes
One of the key features of the AFM is its low noise levels in both the Z direction and XY direction, ensuring accurate and reliable measurements. The noise level in the Z direction is an impressive 0.04 Nm, providing exceptional sensitivity for capturing subtle surface variations and interactions. In the XY direction, the noise level is maintained at 0.4 Nm, further enhancing the precision of the imaging and scanning process.
The AFM offers a generous sample size capacity of 25 mm, accommodating a wide range of samples for analysis. Its versatile scanning method utilizes XYZ three-axis full sample scanning, allowing for comprehensive measurements and analysis of the sample surface. The scanning range of the AFM is extensive, covering 100 μm x 100 μm x 10 μm, enabling detailed imaging and mapping of nanostructures and surface features.
Researchers and scientists can benefit greatly from the AFM's capabilities in nanoscale electrical measurement, which enables the characterization of electrical properties at the nanometer scale. The Electrostatic Force Microscopy feature of the AFM allows for the investigation of surface charge distribution and electrostatic interactions, providing valuable insights into the behavior of materials at the atomic level.
In conclusion, the Atomic Force Microscope is a sophisticated instrument that offers unparalleled precision, sensitivity, and versatility for nanoscale imaging and measurements. With its advanced features, low noise levels, and comprehensive scanning capabilities, the AFM is an indispensable tool for scientific research and exploration in various disciplines.
| Sample Size | 25 mm |
| Scanning Rate | 0.1-30 Hz |
| Scanning Range | 100 μm x 100 μm x 10 μm |
| Nonlinearity | 0.02% in the XY direction and 0.08% in the Z direction |
| Noise Level in the Z Direction | 0.04 Nm |
| Scanning Method | XYZ Three-axis Full Sample Scanning |
| Noise Level in the XY Direction | 0.4 Nm |
One of the key application occasions for the AtomEdge Pro is in surface analysis . Researchers and scientists can utilize this AFM to investigate the topography and properties of a wide range of surfaces at the nanoscale level. The instrument's noise levels in the Z direction, measuring 0.04 Nm, ensure accurate and reliable measurements, making it ideal for surface roughness analysis and characterization.
Another important scenario for using the AtomEdge Pro is in materials science research. The scanning range of 100 μm X 100 μm x 10 μm, coupled with a noise level of 0.4 Nm in the XY direction, enables detailed examination of material properties at the nanoscale. Whether studying thin films, polymers, or composites, this AFM provides valuable insights into material composition and structure.
Moreover, the AtomEdge Pro's scanning method, utilizing XYZ three-axis full sample scanning, offers flexibility and precision in imaging various samples. Researchers can explore nanomaterials , biological samples, and semiconductor devices with ease, thanks to the instrument's scanning rate of 0.1-30 Hz.
In academia, the AtomEdge Pro serves as an indispensable tool for nanotechnology research, allowing scientists to delve into the intricate world of nanomaterials and nanostructures. Its advanced capabilities and user-friendly interface make it a preferred choice for studying nanoscale phenomena and conducting experiments with high precision.